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"Random test program generation for verification and validation of the ..."

Bernhard Egger et al. (2019)

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DOI: 10.1016/J.SYSARC.2019.05.007

access: closed

type: Journal Article

metadata version: 2024-05-05

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Bernhard Egger, Eunjin Song, Hochan Lee, Daeyong Shin:
Random test program generation for verification and validation of the Samsung Reconfigurable Processor. J. Syst. Archit. 97: 219-238 (2019)

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