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"Multiple stuck-at faults detection in CMOS combinational gates."

Giacomo Buonanno et al. (1991)

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DOI: 10.1016/0165-6074(91)90436-W

access: closed

type: Journal Article

metadata version: 2023-08-28

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  - journals/jsa/BuonannoLSS91
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  - https://dblp.org/rec/journals/jsa/BuonannoLSS91
Giacomo Buonanno, Fabrizio Lombardi, Donatella Sciuto, Y.-N. Sken:
Multiple stuck-at faults detection in CMOS combinational gates. Microprocessing and Microprogramming 32(1-5): 775-782 (1991)

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