"Economic optimization of off-line inspection with inspection errors."

S. H. Sheu et al. (2003)

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DOI: 10.1057/PALGRAVE.JORS.2601582

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type: Journal Article

metadata version: 2020-06-08

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S. H. Sheu, Y. C. Chen, W. Y. Wang, N. H. Shin:
Economic optimization of off-line inspection with inspection errors. J. Oper. Res. Soc. 54(8): 888-895 (2003)

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