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"Improvement of Negative Bias Temperature Instability Circuit Reliability ..."

Freddy Forero, Andres F. Gomez, Víctor H. Champac (2016)

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DOI: 10.1166/JOLPE.2016.1457

access: closed

type: Journal Article

metadata version: 2020-05-22

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Freddy Forero, Andres F. Gomez, Víctor H. Champac:
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage. J. Low Power Electron. 12(4): 395-402 (2016)

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