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"Automotive Reliable Memories Integrated into an Ultra-Low Power 40 nm CMOS ..."

S. Badrudduza et al. (2018)

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DOI: 10.1166/JOLPE.2018.1570

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/jolpe/BadrudduzaAJGRC18
S. Badrudduza, G. Abeln, T. Jew, P. Grudowski, A. Roy, C. Cavins:
Automotive Reliable Memories Integrated into an Ultra-Low Power 40 nm CMOS Logic Process. J. Low Power Electron. 14(3): 393-403 (2018)

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