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"A heuristic fault based optimization approach to reduce test vectors count ..."

Vinod Kumar Khera, R. K. Sharma, A. K. Gupta (2019)

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DOI: 10.1016/J.JKSUCI.2017.02.001

access: closed

type: Journal Article

metadata version: 2020-12-07

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  - https://dblp.org/rec/journals/jksucis/KheraSG19
Vinod Kumar Khera, R. K. Sharma, A. K. Gupta:
A heuristic fault based optimization approach to reduce test vectors count in VLSI testing. J. King Saud Univ. Comput. Inf. Sci. 31(2): 229-234 (2019)

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