"A novel joint segmentation approach for wafer surface defect ..."

Zhouzhouzhou Mei et al. (2025)

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DOI: 10.1007/S10845-024-02324-3

access: closed

type: Journal Article

metadata version: 2025-04-01

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Zhouzhouzhou Mei, Yuening Luo, Yibo Qiao, Yining Chen:
A novel joint segmentation approach for wafer surface defect classification based on blended network structure. J. Intell. Manuf. 36(3): 1907-1921 (2025)

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