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"Automatic inspection system of LED chip using two-stages back-propagation ..."

Chung-Feng Jeffrey Kuo et al. (2014)

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DOI: 10.1007/S10845-012-0725-7

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/jim/KuoHLW14
Chung-Feng Jeffrey Kuo, Chien-Tung Max Hsu, Zong-Xian Liu, Han-Cheng Wu:
Automatic inspection system of LED chip using two-stages back-propagation neural network. J. Intell. Manuf. 25(6): 1235-1243 (2014)

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