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"Wafer map defect recognition based on multi-scale feature fusion and ..."
Shouhong Chen et al. (2025)
- Shouhong Chen, Zhentao Huang
, Tao Wang, Xingna Hou
, Jun Ma:
Wafer map defect recognition based on multi-scale feature fusion and attention spatial pyramid pooling. J. Intell. Manuf. 36(1): 271-284 (2025)

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