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"Research on environmental reliability test and assessment of AI devices ..."

Xingge Li et al. (2024)

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DOI: 10.3233/JIFS-234179

access: closed

type: Journal Article

metadata version: 2024-05-07

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Xingge Li, Shufeng Zhang, Xun Chen, Yashun Wang, Zhengwei Fan:
Research on environmental reliability test and assessment of AI devices under vibration stress1. J. Intell. Fuzzy Syst. 46(1): 1833-1852 (2024)

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