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"A High-Frequency Signal Test Method for Embedded CMOS Op-amps."

Kang Chul Kim, Seok Bung Han (2005)

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DOI: —

access: open

type: Journal Article

metadata version: 2021-02-16

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  dblp key:
  - journals/jicce/KimH05
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  - https://dblp.org/rec/journals/jicce/KimH05
Kang Chul Kim, Seok Bung Han:
A High-Frequency Signal Test Method for Embedded CMOS Op-amps. J. Inform. and Commun. Convergence Engineering 3(1): 28-32 (2005)

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