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"Deep Neural Network-Based Detection and Verification of Microelectronic ..."

Md. Alimoor Reza, Zhenhua Chen, David J. Crandall (2020)

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DOI: 10.1007/S41635-019-00088-4

access: closed

type: Journal Article

metadata version: 2023-08-28

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Md. Alimoor Reza, Zhenhua Chen, David J. Crandall:
Deep Neural Network-Based Detection and Verification of Microelectronic Images. J. Hardw. Syst. Secur. 4(1): 44-54 (2020)

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