Stop the war!
Остановите войну!
for scientists:
default search action
"B-open Defect: A Novel Defect Model in FinFET Technology."
Freddy Forero, Víctor H. Champac, Michel Renovell (2023)
- Freddy Forero, Víctor H. Champac, Michel Renovell:
B-open Defect: A Novel Defect Model in FinFET Technology. ACM J. Emerg. Technol. Comput. Syst. 19(1): 3:1-3:19 (2023)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.