"B-open Defect: A Novel Defect Model in FinFET Technology."

Freddy Forero, Víctor H. Champac, Michel Renovell (2023)

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DOI: 10.1145/3564244

access: closed

type: Journal Article

metadata version: 2023-04-29

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Freddy Forero, Víctor H. Champac, Michel Renovell:
B-open Defect: A Novel Defect Model in FinFET Technology. ACM J. Emerg. Technol. Comput. Syst. 19(1): 3:1-3:19 (2023)

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