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"Guest Editorial: Special Section on Machine Vision for Industrial Inspection."

Kenneth W. Tobin, John W. V. Miller (2001)

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DOI: 10.1117/1.1337356

access: closed

type: Journal Article

metadata version: 2019-10-19

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  - https://dblp.org/rec/journals/jei/TobinM01
Kenneth W. Tobin, John W. V. Miller:
Guest Editorial: Special Section on Machine Vision for Industrial Inspection. J. Electronic Imaging 10(1): 194-195 (2001)

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