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"Magnification-continuous static calibration model of a scanning-electron ..."

Abed C. Malti et al. (2012)

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DOI: 10.1117/1.JEI.21.3.033020

access: closed

type: Journal Article

metadata version: 2017-05-28

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Abed C. Malti, Sounkalo Dembélé, Nadine Le Fort-Piat, Patrick Rougeot, Roland Salut:
Magnification-continuous static calibration model of a scanning-electron microscope. J. Electronic Imaging 21(3): 033020 (2012)

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