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"Modal approach based on global stereocorrelation for defects measurement ..."

Khalil Hachem et al. (2024)

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DOI: 10.1117/1.JEI.33.3.031206

access: closed

type: Journal Article

metadata version: 2024-04-29

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Khalil Hachem, Yann Quinsat, Christophe Tournier, Nicolas Beraud:
Modal approach based on global stereocorrelation for defects measurement in wire-laser additive manufacturing. J. Electronic Imaging 33(3) (2024)

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