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"Leakage Current Estimation of CMOS Circuit with Stack Effect."

Yongjun Xu et al. (2004)

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DOI: 10.1007/BF02945598

access: closed

type: Journal Article

metadata version: 2017-05-28

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  dblp key:
  - journals/jcst/XuLLLH04
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  - https://dblp.org/rec/journals/jcst/XuLLLH04
Yongjun Xu, Zuying Luo, Xiaowei Li, Li-Jian Li, Xianlong Hong:
Leakage Current Estimation of CMOS Circuit with Stack Effect. J. Comput. Sci. Technol. 19(5): 708-717 (2004)

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