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"Forecasting the Efficiency of Test Generation Algorithms for Combinational ..."

Shiyi Xu, Tukwasibwe Justaf Frank (2000)

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DOI: 10.1007/BF02948868

access: closed

type: Journal Article

metadata version: 2017-05-28

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Shiyi Xu, Tukwasibwe Justaf Frank:
Forecasting the Efficiency of Test Generation Algorithms for Combinational Circuits. J. Comput. Sci. Technol. 15(4): 326-337 (2000)

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