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"Response of Commercial P-Channel Power VDMOS Transistors to Ionizing ..."

Sandra Veljkovic et al. (2022)

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DOI: 10.1142/S0218126622400035

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/jcsc/VeljkovicMDGDPSSAPMPRD22
Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic:
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. J. Circuits Syst. Comput. 31(18): 2240003:1-2240003:25 (2022)

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