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"A Novel Test Pattern Optimization Method Using Recurrent Neural Network."

S. Asha Pon, V. Jeyalakshmi (2024)

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DOI: 10.1142/S0218126624500762

access: closed

type: Journal Article

metadata version: 2024-05-04

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S. Asha Pon, V. Jeyalakshmi:
A Novel Test Pattern Optimization Method Using Recurrent Neural Network. J. Circuits Syst. Comput. 33(4): 2450076:1-2450076:25 (2024)

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