"Electrical Characterization of the Clamping Behavior on CMOS ..."

Jesus E. Molinar-Solis et al. (2024)

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DOI: 10.1142/S0218126624500683

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type: Journal Article

metadata version: 2024-05-04

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Jesus E. Molinar-Solis, Daniel Sanchez-Arias, Daniel Fajardo-Delgado, Juan Jesús Ocampo Hidalgo, Ivan R. Padilla-Cantoya:
Electrical Characterization of the Clamping Behavior on CMOS Quasi-Floating-Gate Circuits. J. Circuits Syst. Comput. 33(4): 2450068:1-2450068:17 (2024)

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