![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
"Automatic Test Pattern Generation Through Boolean Satisfiability for ..."
Hossein Mokhtarnia, Shahram Etemadi Borujeni, Sayyed Mohammad Saeed Ehsani (2019)
- Hossein Mokhtarnia, Shahram Etemadi Borujeni
, Sayyed Mohammad Saeed Ehsani:
Automatic Test Pattern Generation Through Boolean Satisfiability for Testing Bridging Faults. J. Circuits Syst. Comput. 28(14): 1950240:1-1950240:26 (2019)
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.