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"An Efficient Test Procedure for Functional Faults in semiconductor Random ..."

Yun-Hong Kim et al. (1991)

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DOI: 10.1142/S0218126691000069

access: closed

type: Journal Article

metadata version: 2020-08-25

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Yun-Hong Kim, In-Sik Hong, Jun-Mo Jung, Young-Oo Kim, In-Chil Lim:
An Efficient Test Procedure for Functional Faults in semiconductor Random Access Memories. J. Circuits Syst. Comput. 1(2): 229-238 (1991)

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