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"Genetic-Algorithm-based Test Pattern Generation for Crosstalk Faults ..."

Kishore K. Duganapalli, Ajoy Kumar Palit, Walter Anheier (2016)

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DOI: 10.1142/S0218126616400181

access: closed

type: Journal Article

metadata version: 2021-03-23

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  - https://dblp.org/rec/journals/jcsc/DuganapalliPA16
Kishore K. Duganapalli, Ajoy Kumar Palit, Walter Anheier:
Genetic-Algorithm-based Test Pattern Generation for Crosstalk Faults between On-Chip Aggressor and Victim. J. Circuits Syst. Comput. 25(3): 1640018:1-1640018:14 (2016)

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