default search action
"Digital Embedded Test Instrument for On-Chip Phase Noise Testing of ..."
Florence Azaïs et al. (2016)
- Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. J. Circuits Syst. Comput. 25(3): 1640014:1-1640014:18 (2016)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.