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"Itô-SDE MCMC method for Bayesian characterization of errors ..."
Maarten Arnst et al. (2017)
- Maarten Arnst
, B. Abello Álvarez, J.-P. Ponthot, Romain Boman
:
Itô-SDE MCMC method for Bayesian characterization of errors associated with data limitations in stochastic expansion methods for uncertainty quantification. J. Comput. Phys. 349: 59-79 (2017)
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