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"Algorithms for testing occurrences of length 4 patterns in permutations."

Yijie Han, Sanjeev Saxena (2018)

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DOI: 10.1007/S10878-017-0163-8

access: closed

type: Journal Article

metadata version: 2018-01-11

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Yijie Han, Sanjeev Saxena:
Algorithms for testing occurrences of length 4 patterns in permutations. J. Comb. Optim. 35(1): 189-208 (2018)

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