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"Simulation-Based Methods for Model Building and Refinement in Cryoelectron ..."

Thomas Dodd, Chunli Yan, Ivaylo Ivanov (2020)

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DOI: 10.1021/ACS.JCIM.0C00087

access: closed

type: Journal Article

metadata version: 2021-09-01

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Thomas Dodd, Chunli Yan, Ivaylo Ivanov:
Simulation-Based Methods for Model Building and Refinement in Cryoelectron Microscopy. J. Chem. Inf. Model. 60(5): 2470-2483 (2020)

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