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"Cross-Validation of Data Compatibility Between Small Angle X-ray ..."

Jin Seob Kim, Bijan Afsari, Gregory S. Chirikjian (2017)

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DOI: 10.1089/CMB.2016.0139

access: closed

type: Journal Article

metadata version: 2020-03-12

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Jin Seob Kim, Bijan Afsari, Gregory S. Chirikjian:
Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy. J. Comput. Biol. 24(1): 13-30 (2017)

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