"Measuring technological distance for patent mapping."

Bowen Yan, Jianxi Luo (2017)

> Home

Details and statistics

DOI: 10.1002/ASI.23664

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jasis/YanL17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jasis/YanL17
Bowen Yan, Jianxi Luo:
Measuring technological distance for patent mapping. J. Assoc. Inf. Sci. Technol. 68(2): 423-437 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.