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"A Novel Two-Terminal Reliability Analysis for MANET."

Xibin Zhao, Zhiyang You, Hai Wan (2013)

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DOI: 10.1155/2013/216186

access: open

type: Journal Article

metadata version: 2020-07-16

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  dblp key:
  - journals/jam/ZhaoYW13
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  - https://dblp.org/rec/journals/jam/ZhaoYW13
Xibin Zhao, Zhiyang You, Hai Wan:
A Novel Two-Terminal Reliability Analysis for MANET. J. Appl. Math. 2013: 216186:1-216186:9 (2013)

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