Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Formal Specification Based Automatic Test Generation for Embedded Network ..."

Eun-Hye Choi et al. (2014)

> Home

Details and statistics

DOI: 10.1155/2014/909762

access: open

type: Journal Article

metadata version: 2020-07-16

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/jam/ChoiNATAYMO14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jam/ChoiNATAYMO14
Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki:
Formal Specification Based Automatic Test Generation for Embedded Network Systems. J. Appl. Math. 2014: 909762:1-909762:21 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.