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ORCID"TSV Manufacturing Fault Modeling and Diagnosis Based on Multi-Tone Dither."
Yuling Shang et al. (2019)
- Yuling Shang, Min Tan, Chunquan Li, Liyuan Sun:
TSV Manufacturing Fault Modeling and Diagnosis Based on Multi-Tone Dither. J. Adv. Comput. Intell. Intell. Informatics 23(1): 42-51 (2019)
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