"An eigenvalue-based similarity measure and its application in defect ..."

Du-Ming Tsai, Ron-Hwa Yang (2005)

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DOI: 10.1016/J.IMAVIS.2005.07.014

access: closed

type: Journal Article

metadata version: 2020-02-20

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Du-Ming Tsai, Ron-Hwa Yang:
An eigenvalue-based similarity measure and its application in defect detection. Image Vis. Comput. 23(12): 1094-1101 (2005)

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