"A novel algorithm for defect inspection of touch panels."

Mao-Hsiung Hung, Chaur-Heh Hsieh (2015)

> Home

Details and statistics

DOI: 10.1016/J.IMAVIS.2015.06.001

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ivc/HungH15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ivc/HungH15
Mao-Hsiung Hung, Chaur-Heh Hsieh:
A novel algorithm for defect inspection of touch panels. Image Vis. Comput. 41: 11-25 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.