"Efficient 3D characterization of raised topological defects in smooth ..."

Pradeep Gnanaprakasam et al. (2009)

> Home

Details and statistics

DOI: 10.1016/J.IMAVIS.2008.03.008

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ivc/GnanaprakasamPGH09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ivc/GnanaprakasamPGH09
Pradeep Gnanaprakasam, Johné M. Parker, Subburengan Ganapathiraman, Zhen Hou:
Efficient 3D characterization of raised topological defects in smooth specular coatings. Image Vis. Comput. 27(4): 319-330 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.