"Analogue Integrated Circuits Design-for-Testability Flow Oriented onto ..."

Sergey G. Mosin (2018)

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DOI: 10.5755/J01.ITC.47.3.19753

access: open

type: Journal Article

metadata version: 2025-01-19

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Sergey G. Mosin:
Analogue Integrated Circuits Design-for-Testability Flow Oriented onto OBIST Strategy. Inf. Technol. Control. 47(3): 521-531 (2018)

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