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"A self-adaptive class-imbalance TSK neural network with applications to ..."

Shing Chiang Tan, Shuming Wang, Junzo Watada (2018)

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DOI: 10.1016/J.INS.2017.10.040

access: closed

type: Journal Article

metadata version: 2022-06-23

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Shing Chiang Tan, Shuming Wang, Junzo Watada:
A self-adaptive class-imbalance TSK neural network with applications to semiconductor defects detection. Inf. Sci. 427: 1-17 (2018)

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