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"Measurement Results of Real Circuit Delay Degradation under Realistic ..."

Kotaro Shimamura, Takeshi Takehara, Naohiro Ikeda (2023)

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DOI: 10.2197/IPSJTSLDM.16.27

access: closed

type: Journal Article

metadata version: 2023-03-07

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Kotaro Shimamura, Takeshi Takehara, Naohiro Ikeda:
Measurement Results of Real Circuit Delay Degradation under Realistic Workload. IPSJ Trans. Syst. LSI Des. Methodol. 16: 27-34 (2023)

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