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"Diagnosis Methods for Gate Delay Faults with Various Amounts of Delays."

Yoshinobu Higami et al. (2016)

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DOI: 10.2197/IPSJTSLDM.9.13

access: closed

type: Journal Article

metadata version: 2020-09-29

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  - https://dblp.org/rec/journals/ipsj/HigamiWTKS16
Yoshinobu Higami, Senling Wang, Hiroshi Takahashi, Shin-ya Kobayashi, Kewal K. Saluja:
Diagnosis Methods for Gate Delay Faults with Various Amounts of Delays. IPSJ Trans. Syst. LSI Des. Methodol. 9: 13-20 (2016)

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