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"Technostress causes cognitive overload in high-stress people: Eye tracking ..."

Se Young Kim et al. (2022)

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DOI: 10.1016/J.IPM.2022.103093

access: open

type: Journal Article

metadata version: 2023-09-12

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  - https://dblp.org/rec/journals/ipm/KimPKKS22
Se Young Kim, Hahyeon Park, Hongbum Kim, Joon Kim, Kyoungwon Seo:
Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test. Inf. Process. Manag. 59(6): 103093 (2022)

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