"TXL-Fuzz: A Long Attention Mechanism-Based Fuzz Testing Model for ..."

Liangyin Chen et al. (2024)

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DOI: 10.1109/JIOT.2024.3444893

access: closed

type: Journal Article

metadata version: 2024-12-22

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Liangyin Chen, Yihan Wang, Xuanyi Xiang, Dian Jin, Yi Ren, Yunhai Zhang, Zhiwen Pan, Yanru Chen:
TXL-Fuzz: A Long Attention Mechanism-Based Fuzz Testing Model for Industrial IoT Protocols. IEEE Internet Things J. 11(23): 38238-38245 (2024)

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