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"Reordering method of test set based on vector eigenvalues using critical ..."

Wenfa Zhan, Luping Zhang (2024)

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DOI: 10.1016/J.VLSI.2024.102169

access: closed

type: Journal Article

metadata version: 2024-07-11

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Wenfa Zhan, Luping Zhang:
Reordering method of test set based on vector eigenvalues using critical area estimation. Integr. 96: 102169 (2024)

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