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"Scaling trends of power noise in 3-D ICs."

Kan Xu, Eby G. Friedman (2015)

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DOI: 10.1016/J.VLSI.2015.07.007

access: closed

type: Journal Article

metadata version: 2020-02-20

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Kan Xu, Eby G. Friedman:
Scaling trends of power noise in 3-D ICs. Integr. 51: 139-148 (2015)

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