Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Test and diagnosis pattern generation for distinguishing stuck-at faults ..."

Navya Mohan, J. P. Anita (2022)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2021.12.002

access: closed

type: Journal Article

metadata version: 2022-02-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/MohanA22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/MohanA22
Navya Mohan, J. P. Anita:
Test and diagnosis pattern generation for distinguishing stuck-at faults and bridging faults. Integr. 83: 24-32 (2022)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.