"On characterization of catastrophic faults in two-dimensional VLSI arrays."

Soumen Maity, Amiya Nayak, Bimal K. Roy (2004)

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DOI: 10.1016/J.VLSI.2004.07.013

access: closed

type: Journal Article

metadata version: 2023-11-12

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Soumen Maity, Amiya Nayak, Bimal K. Roy:
On characterization of catastrophic faults in two-dimensional VLSI arrays. Integr. 38(2): 267-281 (2004)

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