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"Grammar-based fuzz testing for microprocessor RTL design."

Dan Luo et al. (2022)

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DOI: 10.1016/J.VLSI.2022.05.001

access: closed

type: Journal Article

metadata version: 2022-08-25

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Dan Luo, Tun Li, Liqian Chen, Hongji Zou, Mingchuan Shi:
Grammar-based fuzz testing for microprocessor RTL design. Integr. 86: 64-73 (2022)

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