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"A high reliability under-voltage lock out circuit for power driver IC."

Liqiang Ding et al. (2023)

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DOI: 10.1016/J.VLSI.2022.09.011

access: closed

type: Journal Article

metadata version: 2022-12-07

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  - journals/integration/DingCGXG23
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  - https://dblp.org/rec/journals/integration/DingCGXG23
Liqiang Ding, Xiaowu Cai, Mali Gao, Ruirui Xia, Yuexin Gao:
A high reliability under-voltage lock out circuit for power driver IC. Integr. 88: 166-172 (2023)

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