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"Avoidance vs. repair: New approaches to increasing electromigration ..."

Steve Bigalke, Jens Lienig (2020)

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DOI: 10.1016/J.VLSI.2020.04.009

access: closed

type: Journal Article

metadata version: 2020-09-30

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  - https://dblp.org/rec/journals/integration/BigalkeL20
Steve Bigalke, Jens Lienig:
Avoidance vs. repair: New approaches to increasing electromigration robustness in VLSI routing. Integr. 75: 189-198 (2020)

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