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"Impact of positive bias temperature instability (PBTI) on 3T1D-DRAM cells."

Nivard Aymerich et al. (2012)

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DOI: 10.1016/J.VLSI.2011.11.014

access: closed

type: Journal Article

metadata version: 2023-07-11

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  - journals/integration/AymerichGRCG12
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  - https://dblp.org/rec/journals/integration/AymerichGRCG12
Nivard Aymerich, Shrikanth Ganapathy, Antonio Rubio, Ramon Canal, Antonio González:
Impact of positive bias temperature instability (PBTI) on 3T1D-DRAM cells. Integr. 45(3): 246-252 (2012)

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